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surfaceCONTROL 3D 2500

3D-Snapshot-Sensor zur Oberflächenprüfung großer Objekte

Der 3D-Snapshot-Sensor surfaceCONTROL 3D 2500 wird für die 3D-Messung zur Geometrie, Form und Oberflächenprüfung auf diffus reflektierenden Oberflächen eingesetzt. Dabei kann der Sensor sowohl in der automatisierten Inlineprüfung, At-Line als auch im Messraum eingesetzt werden. Durch das Prinzip der Streifenlichtprojektion lässt sich eine direkte 3D-Vermessung realisieren. Der Sensor zeichnet sich durch sein großes Messfeld sowie einer hohen Messbereichstiefe von bis zu 300 mm bei einer gleichzeitigen Wiederholpräzision von bis zu 3,0 µm aus. Die aufgenommenen Bilder werden an den externen Controller übergeben und dort zu 3D-Daten verrechnet. Unterschiedliche Messfelder werden durch drei Modelle abgedeckt.

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Besonderheiten

  1. Messung großer Objekte max. 650 x 495 mm
  2. Hohe Messbereichstiefe bis zu 300 mm
  3. Aufnahmezeit ab 0,5 s
  4. Höchste Präzision bis zu 0,5 μm
  5. Digitale Schnittstellen (über Controller 2500): GigE Vision/GenICam
  6. Digitale Schnittstellen (über 2D/3D Gateway): Gigabit Ethernet (GigE Vision / GenICam) / USB2.0 / PROFINET / EtherCAT / EtherNet/IP
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3D-Messung der neuen Generation

Der SC2500 Controller bietet eine schnelle Datenausgabe über die Gigabit Ethernet Schnittstellen. Durch die Nutzung des 2D/3D-Gateway II stehen EtherNET/IP, PROFINET sowie EtherCAT zur Verfügung. Über die leistungsstarken Softwaretools 3DInspect, DefMap3D sowie InspectionTools kann eine präzise 3D-Messung sowie eine Oberflächeninspektion durchgeführt werden. Die GigE Vision-Kompatibilität erlaubt zudem die problemlose Einbindung in Bildverarbeitungssoftware von Drittanbietern. Ein umfangreiches SDK zur kundenseitigen Softwareintegration rundet das Softwarepaket ab.

Anwendungsbeispiele:

  • 3D-Prüfung der Geometrie, Formerfassung und Oberflächenprüfung
  • Automatisierung, Fertigungs- und Prozessüberwachung sowie Qualitätskontrolle
  • Berührungslose Vermessung von diffus reflektierenden Oberflächen im Stop&Go Prozess
  • Form-, Lage- und Oberflächenprüfung